JAI‘s prism-based infrared camera has been especially developed for the short-wavelength infrared spectrum (SWIR) and combines the benefits of simultaneous dual-band line scan cameras and IR imaging.
The two InGaAs line scan sensors with wavelength bands ranging from 900 nm up to 1350 nm as well as from 1400 nm up to 1700 nm reach highest spatial resolutions. They offer three times higher resolutions than conventional InGaAs area detectors and enable you to acquire images that R-G-B and NIR will not be able to identify. The JAI WA-1000D-CL is perfectly suited for the inline testing of material on conveyor belts, such as the sorting of flakes made from different types of plastic.
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Short wave infrared (SWIR) line scan camera with CameraLink
For more than 50 years JAI has delivered industrial CCD and CMOS cameras with innovative engineering, high-end quality, and operational reliability and durability.