JAI‘s prism-based infrared camera has been especially developed for the short-wavelength infrared spectrum (SWIR) and combines the benefits of simultaneous dual-band line scan cameras and IR imaging.
The two InGaAs line scan sensors with wavelength bands ranging from 900 nm up to 1350 nm as well as from 1400 nm up to 1700 nm reach highest spatial resolutions. They offer three times higher resolutions than conventional InGaAs area detectors and enable you to acquire images that R-G-B and NIR will not be able to identify.
The JAI WA-1000D-CL is perfectly suited for the inline testing of material on conveyor belts, such as the sorting of flakes made from different types of plastic.
Reasons to use the JAI Wave
2 InGaAs line scan sensors for high-precision inspection tasks.
No need for a second camera and expensive SWIR band pass filters.
You can detect product defects in various materials that are invisible to the human eye.
Markets & applications
Observation of dying and coating processes
Resolution: 1024 pixels x 2
Line rate: 39 kHz
Camera mount: M52 x 0.75
Interface: CameraLink: switchable between dual-base and 2-ch configuration (8-bit: Base, 10-/12-bit: Medium)